| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
| Make |
Model |
| |
|
$ |
|
 |
115697 |
Bio-Rad |
Q5 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
Bio-Rad Q5 CD Measurement, Single and Two-Axis Overlay Registration |
 |
54905 |
Bio-Rad |
Q7/Q8 |
in Critical Dimension Measurement Equipment
|
2
|
|
|
  |
| |
Bio-Rad Q7/Q8 Bio-Rad Q7/Q8 Overlay Metrology Tool for up to 200mm Wafers |
 |
113771 |
Hitachi |
S-4500 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
HITACHI S-4500 SCANNING ELECTRON MICROSCOPE Electron Scanning Microscope
|
 |
89744 |
Hitachi |
S-4700 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
| |
Hitachi S-4700 Hitachi S-4700 Field Emission/Scanning Electron Microscope |
 |
118934 |
Hitachi |
S-7000 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
Hitachi S-7000 CD SEM Measurement Tool |
 |
44179 |
Hitachi |
S-7800/S-8820 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
Hitachi S-7800 or S-8820 Hitachi S-7800 or S-8820 External Power Supply Cabinet with 4 New Contactors |
 |
76095 |
JEOL |
JWS-7505ZH |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
JEOL JWS-7505ZH JEOL JWS-7505ZH CD-SEM |
 |
71132 |
Nanometrics |
Nanoline 50-2 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
NANOMETRICS NANOLINE 50-2 Nanometrics Nanoline 50-2 CD Measurement System. Includes TMC Technical Vibration Table. |
 |
104942 |
Oxford Instruments |
7200 |
in Critical Dimension Measurement Equipment
|
1
|
|
|
  |
| |
Oxford Instruments EDX Model 7200 & Controller Oxford Instruments EDX Model 7200 wit controller and software, serial # is 04838-2390-289-51 / Det. Area:10mm2 / Att.1:327629805 / Window:ATW2 / Att.2:0120024 / Resol:138eV / Bias:-500V |
 |
71139 |
Tamar Technologies |
CD Measure |
in Critical Dimension Measurement Equipment
|
1
|
|
|
F* |
| |
TAMAR TECHNOLOGY Tamar Technology Semi-Automated Critical Dimension Measurement System. |