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Critical Dimension Measurement Equipment


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List all 4 product types under Critical Dimension Measurement EquipmentList all 4 product types under Critical Dimension Measurement Equipment

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  •  Offered (box) or Wanted (coins)  Item ID  Short Description Product Type / Details # Price Note
    Make Model
      $  
    Offer 115697

    Bio-Rad

    Q5

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    1
      Bio-Rad Q5 CD Measurement, Single and Two-Axis Overlay Registration
    Offer 54905

    Bio-Rad

    Q7/Q8

    List all items of this typeOverlay Registration

    in Critical Dimension Measurement Equipment

    2
      Bio-Rad Q7/Q8 Bio-Rad Q7/Q8 Overlay Metrology Tool for up to 200mm Wafers
    Offer 113771

    Hitachi

    S-4500

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    1
      HITACHI S-4500 SCANNING ELECTRON MICROSCOPE Electron Scanning Microscope
    Offer 89744

    Hitachi

    S-4700

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    1 F*
      Hitachi S-4700 Hitachi S-4700 Field Emission/Scanning Electron Microscope
    Offer 118934

    Hitachi

    S-7000

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    1
      Hitachi S-7000 CD SEM Measurement Tool
    Offer 44179

    Hitachi

    S-7800/S-8820

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    1
      Hitachi S-7800 or S-8820 Hitachi S-7800 or S-8820 External Power Supply Cabinet with 4 New Contactors
    Offer 76095

    JEOL

    JWS-7505ZH

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    1
      JEOL JWS-7505ZH JEOL JWS-7505ZH CD-SEM
    Offer 71132

    Nanometrics

    Nanoline 50-2

    List all items of this typeOptical CD Measurement

    in Critical Dimension Measurement Equipment

    1
      NANOMETRICS NANOLINE 50-2 Nanometrics Nanoline 50-2 CD Measurement System. Includes TMC Technical Vibration Table.
    Offer 104942

    Oxford Instruments

    7200

    List all items of this typeCD Measurement - Other

    in Critical Dimension Measurement Equipment

    1
      Oxford Instruments EDX Model 7200 & Controller Oxford Instruments EDX Model 7200 wit controller and software, serial # is 04838-2390-289-51 / Det. Area:10mm2 / Att.1:327629805 / Window:ATW2 / Att.2:0120024 / Resol:138eV / Bias:-500V
    Offer 71139

    Tamar Technologies

    CD Measure

    List all items of this typeCritical Dimension Scanning Electron Microscopes

    in Critical Dimension Measurement Equipment

    1 F*
      TAMAR TECHNOLOGY Tamar Technology Semi-Automated Critical Dimension Measurement System.


    *  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer
    NOTE:
       when photo available
       when document attached
      F* if the item is specially featured
      N* if the item is newly added, and/or
      R* if the item's price is recently reduced.