| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
| Make |
Model |
| |
|
$ |
|
 |
98523 |
Bio-Rad |
QS-300 |
in Spectrometers
|
1
|
|
|
F* |
| |
Bio-Rad QS-300 150mm Bio-Rad QS-300 FTIR Spectrometer |
 |
102212 |
Bio-Rad |
QS-312 |
in Spectrometers
|
1
|
|
|
  |
| |
Bio-Rad QS-312 Bio-Rad QS-312 FT-IR Spectrometer |
 |
117040 |
Bio-Rad |
S-300 |
in Spectrometers
|
1
|
|
|
F* |
| |
Bio-Rad S-300 Bio-Rad S-300 Spectrometer FTIR |
 |
89756 |
KLA-Tencor |
P-1 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
KLA-Tencor P-1 200mm KLA-Tencor P-1 High Sensitivity Surface Profiler |
 |
124560 |
KLA-Tencor |
P-11 |
in Film Thickness Testers
|
1
|
|
30,000.00
|
  |
| |
KLA/Tencor P-11 Profilometer Guaranteed functional at time of source inspection. |
 |
124549 |
Metricon |
PC-2000 |
in Film Thickness Testers
|
1
|
|
5,000.00
|
  |
| |
Metricon PC-2000 Thin Film Thickness and Refractive Index Measurement System. Unparalled accuracy in measurement of thin film thickness, refractive index and bulk refractive index.
Prism Coupler Instrument |
 |
89821 |
Nanometrics |
8300X |
in Film Thickness Testers
|
1
|
|
|
  |
| |
Nanometrics 8300X Auto-Load 200mm/300mm Nanometrics 8300X Film Thickness Analyzer with Spectroscopic Ellipsometry |
 |
102865 |
Nanometrics |
NanoSpec / AFT 2100 |
in Film Thickness Testers
|
1
|
|
|
F* |
| |
Nanometrics NanoSpec / AFT 2100UV Nanometrics NanoSpec / AFT 2100UV Thin Film Measurement System.
System is capable of UV measurements. Has two lamps. One is standard halogen lamp. Other is a Deuterium UV lamp. The UV is used for thin films under 500A and special UV programs. |
 |
99360 |
Nicolet |
ECO-8S |
in Spectrometers
|
3
|
|
|
  |
| |
Nicolet ECO-8S Nicolet ECO-8S FTIR Wafer Analysis System |
 |
66537 |
Nicolet |
205 |
in Spectrometers
|
1
|
|
|
F* |
| |
NICOLET SPECTROMETER FT-IR, MODEL 205 Nicolet Spectrometer FT-IR, Model 205, Includes all five disks. |
 |
76100 |
Philips |
PW-2800 |
in Spectrometers
|
1
|
|
|
  |
| |
Philips PW-2800 Philips PW-2800 X-Ray Fluorescent Inspection System |
 |
85708 |
Plas Mos |
SD 2000 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
PLAS MOS SD 2000 PLAS MOS SD 2000 AUTOMATIC ELLIPSOMETER |
 |
99380 |
Prometrix |
FT-530 |
in Spectrometers
|
2
|
|
|
  |
| |
Prometrix FT-530 Prometrix FT-530 Thin Film Measurement System |
 |
99382 |
Prometrix |
FT-650 |
in Spectrometers
|
1
|
|
|
  |
| |
Prometrix FT-650 Prometrix FT-650 Film Thickness Mapping System |
 |
99384 |
Prometrix |
SM-300 |
in Spectrometers
|
1
|
|
|
  |
| |
Prometrix SM-300 Prometrix SM-300 Film Thickness Mapping System |
 |
54927 |
Rigaku |
3700H TXRF |
in Spectrometers
|
1
|
|
|
  |
| |
Rigaku 3700H TXRF 200mm Rigaku 3700H TXRF X-Ray Spectrometer |
 |
89825 |
Rigaku |
Wafer X-300 |
in Spectrometers
|
1
|
|
|
  |
| |
Rigaku Wafer X-300 Rigaku Wafer X-300 X-Ray Fluorescence System |
 |
89903 |
Rudolph Technologies |
Metapulse 300 |
in Film Thickness Testers
|
1
|
|
|
  |
| |
Rudolph Metapulse 300 200mm/300mm Rudolph Metapulse 300 Film Thickness Measurement System |
 |
89961 |
SNP |
9000 |
in Film Thickness Testers
|
1
|
|
|
F* |
| |
Stylus Nano Profilometer 9000 200mm/300mm Stylus Nano Profilometer |