| Item ID |
Short Description |
Product Type / Details |
#
|
Price |
Note |
| Make |
Model |
| |
|
$ |
|
 |
99411 |
Carl Zeiss |
AXIOTRON-S MSM 193 |
in Microscopes
|
1
|
|
|
F* |
| |
CARL ZEISS AXIOTRON-S MSM 193 CARL ZEISS AXIOTRON-S MSM 193 SIMULATION MICROSCOPE |
 |
119926 |
Zeiss |
MSM 100 |
in Microscopes
|
1
|
|
|
F* |
| |
CARL ZEISS MSM 100 CARL ZEISS MSM 100 Simulation Microscope |
 |
115698 |
Hitachi |
IS-3270 |
in Surface Inspection
|
1
|
|
|
 |
| |
Hitachi IS 3270 Hitachi IS-3270 Patterned Wafer Inspection System |
 |
66546 |
Irvine Optical Co. |
Ultra Station 3 |
in Microscopes
|
1
|
|
|
F* |
| |
IRVINE OPTICAL ULTRASTATION 3 INSPECTION STATION IRVINE OPTICAL ULTRASTATION 3 SEMI AUTOMATIC WAFER INSPECTION SYSTEM. S/N 5822. Single cassette loading for 4”, 5”, and 6” wafers. Variable 12V/50W. Vacuum hookup, Pickup and Theta. 6” X 6” travel stage.
Nikon scope and objectives. 4 position head. Currently has 3 objectives: BD Plans 10(.25), 20(.4), 40(.65). Eyepieces Nikon CF10X. BF/DF.
|
 |
120457 |
KLA-Tencor |
Surfscan 6200 (168904) |
in Surface Inspection
|
1
|
|
|
  |
| |
KLA - Tencor Surfscan 6200 Surface haze detection; Capable of handling 4", 5", 6" and 8" wafer - customer to spec wafer; Size Laser type wavelength: ArIon 488 30mW %; Particle Sensitivity: 0.10um @95% um Measurement Range: 0.09-9999um; Haze Sensitivity Resolution 0.05ppm @ 1 Repeatability. |
 |
70874 |
KLA-Tencor |
Surfscan 7600 |
in Surface Inspection
|
2
|
|
|
F* |
| |
KLA-TENCOR 7600 WAFER INSPECTION SYSTEM KLA-Tencor 7600 Wafer Inspection System, one (1) is set up for 8" and other 6" & 8". An adapter plate can be purchased for the 8" tool to allow it to also run 6". |
 |
89759 |
KLA-Tencor |
**Like New** SP-1 Loader(s) |
in Surface Inspection
|
2
|
|
|
  |
| |
KLA-Tencor SP-1 200mm & 300mm KLA-Tencor Wafer Loader(s), Model 378542. |
 |
105921 |
KLA Tencor |
**GUARANTEED** SP-1 Classic |
in Surface Inspection
|
1
|
|
|
  |
| |
KLA-Tencor SP-1 Classic 200mm & 300mm KLA-Tencor SP-1 Classic Surface Inspection System(s), currently set up for 300mm. |
 |
85931 |
KLA-Tencor |
**GUARANTEED** Surfscan 4500 |
in Surface Inspection
|
2
|
|
|
  |
| |
KLA-Tencor Surfscan 4500 150mm KLA-Tencor Surfscan 4500 Particle Measurement System(s) |
 |
55110 |
KLA-Tencor |
Surfscan 7700 |
in Surface Inspection
|
3
|
|
|
  |
| |
KLA-Tencor Surfscan 7700 200mm KLA-Tencor Patterned Wafer Inspection System(s), an adapter plate can be purchased to also run 6". |
 |
98589 |
KLA-Tencor |
AIT-1 |
in Surface Inspection
|
1
|
|
|
  |
| |
KLA-Tencor Surfscan AIT-1 200mm KLA-Tencor Surfscan AIT-1 Patterned Wafer Inspection System |
 |
100991 |
KLA-Tencor |
AIT-1 |
in Surface Inspection
|
1
|
|
|
  |
| |
KLA-Tencor Surfscan AIT-1 200mm KLA-Tencor AIT-1 Patterned Wafer Particle Inspection System |
 |
66540 |
Leica |
Stereo Zoom 4 |
in Microscopes
|
1
|
|
|
F* |
| |
LEICA STEREO ZOOM 4 LEICA STEREOZOOM 4 Microscope with power transformer. Wentworth Labs base 81/2” wide x 10”. Up/down/back/forward scope adjust. 0.7 to 3X zoom range. 10X W.F. adjustable eyepieces. |
 |
118942 |
Olympus |
AL 100-B8 |
in Microscope Inspection Tools
|
1
|
|
|
  |
| |
Olympus AL 100-B8 Programmable Wafer Loader for up to 200mm Wafers |
 |
75546 |
Olympus |
BH |
in Microscopes
|
1
|
|
|
  |
| |
Olympus BH Olympus BH Microscope, Serial Number 854296.
Various Eye Pieces and Optics available. |
 |
66535 |
Olympus |
300702 |
in Microscopes
|
1
|
|
|
  |
| |
OLYMPUS TABLE INSPECTION MICROSCOPE OLYMPUS TABLE INSPECTION MICROSCOPE. Flat base. 110V to 6V built in power supply. Adjustable 6V/15W lamp. 101/4” x 93/4” stage. 4”x 6” travel. Course and fine knob adjust. 4 objectives: Neo 40(.65), 10(.25), 5(.1), M5(.1). Eyepieces WF10X adjustable. Noise slide adjust. |
 |
76098 |
Prometrix |
FT-750 |
in Surface Inspection
|
1
|
|
|
F* |
| |
Prometrix FT-750 Prometrix FT-750 Patterned Wafer Mapping System |
 |
106321 |
Prometrix FT-750 |
in Surface Inspection
|
1
|
|
|
  |
| |
Prometrix FT-750 Prometrix FT-750 Patterned Wafer Mapping System |
 |
115778 |
Prometrix |
Prometrix UV1050 |
in Surface Inspection
|
1
|
|
|
  |
| |
Prometrix UV1050 Thin Film Measurement System |
 |
118941 |
Wild |
M420 |
in Microscopes
|
1
|
|
|
  |